AGING OF CDSEXTE1-X THIN-FILMS NEAR LIQUID-NITROGEN TEMPERATURE

被引:6
|
作者
SEBASTIAN, PJ
SIVARAMAKRISHNAN, V
机构
[1] Thin Film Laboratory, Department of Physics, I.I.T., Madras
来源
关键词
D O I
10.1002/pssa.2211240216
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The low temperature aging (increase in film resistance with time) behaviour of CdSe(x)Te1-x thin films in atmosphere and oxygen is presented. The observed aging in these films is explained using an oxygen chemisorption model. Films aged at lower temperatures attained saturation in film resistance faster than those aged at higher temperatures. This result may be explained by the oxygen chemisorption rate and other factors such as density of physisorbed oxygen, thermal desorption, and diffusion of chemisorbed oxygen into the bulk of the film and the depletion layer depth. X-ray photoelectron spectroscopy (XPS) shows the presence of Cd-O, Se-O, and Te-O bonds in the films.
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页码:505 / 511
页数:7
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