ANALYSIS OF AN N-CHANNEL MOSFET MAGNETIC SENSOR WITH NONUNIFORM IMPURITY PROFILE

被引:3
|
作者
AGRAWAL, R
YADAVA, PK
DWIVEDI, R
SRIVASTAVA, SK
机构
[1] Centre for Research in Microelectronics, Department of Electronics Engineerinng, Institute of Technology, Varanasi
关键词
D O I
10.1016/0924-4247(91)80004-9
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A theoretical analysis is presented of an n-channel MAGFET with a non-uniform (displaced Gaussian function) and a uniform impurity profile for the detection of magnetic fields. Consideration of a non-uniform impurity profile in the channel region of a MAGFET is closer to the practical situation. The Hall voltage and sensitivity of the MAGFET for different magnetic fields, source-drain and gate voltages have been evaluated and compared. The results reveal higher sensitivity of the MAGFET in the triode region of operation when calculated using a non-uniform impurity profile compared to a MAGFET with a uniform impurity profile. The present analysis also includes the effect of the location of the Hall contacts on the MAGFET performance. It indicates that the dependence of the sensitivity on the uniformity of the impurity profile and the effective gate voltage is a minimum when the Hall contact lies at a distance of 0.6 L from the source.
引用
收藏
页码:21 / 28
页数:8
相关论文
共 50 条
  • [41] Analysis and design of vertical N-channel IGBT
    Kumar, A
    Khanna, VK
    ICSE'98: 1998 IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS, PROCEEDINGS, 1998, : 235 - 239
  • [42] Analysis and design of vertical n-channel IGBT
    Central Electronics Engineering, Research Inst, Rajasthan, India
    IEEE Int Conf Semocond Electron Proc ICSE, (235-239):
  • [43] THERMAL EFFECTS IN n-CHANNEL ENHANCEMENT MOSFET'S OPERATED AT CRYOGENIC TEMPERATURES.
    Foty, Daniel P.
    Titcomb, Stephen L.
    1600, (ED-34):
  • [44] 30 V SGT N-Channel MOSFET总剂量效应研究
    徐海铭
    汪敏
    电子与封装, 2023, 23 (11) : 106 - 111
  • [45] DUAL-GATE OPERATION AND VOLUME INVERSION IN N-CHANNEL SOI MOSFET - COMMENT
    BALESTRA, F
    IEEE ELECTRON DEVICE LETTERS, 1992, 13 (12) : 658 - 659
  • [46] 30V High-Side N-channel Lateral Trench MOSFET
    Disney, Don
    Chan, Wilson
    Lam, Roy
    Blattner, Robert
    Ma, Steve
    Seng, Wesley
    Chen, Jun-Wei
    Williams, Richard K.
    2009 21ST INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & ICS, 2009, : 327 - 330
  • [47] Detailed investigation of n-channel enhancement 6H-SiC MOSFET's
    Schörner, R
    Friedrichs, P
    Peters, D
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1999, 46 (03) : 533 - 541
  • [48] CIRCUIT-DESIGN GUIDELINES FOR N-CHANNEL MOSFET HOT-CARRIER ROBUSTNESS
    MISTRY, KR
    FOX, TF
    PRESTON, RP
    ARORA, ND
    DOYLE, BS
    NELSEN, DE
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1993, 40 (07) : 1284 - 1295
  • [49] Lateral N-channel inversion mode 4H-SiC MOSFET's
    Sridevan, S
    Baliga, BJ
    IEEE ELECTRON DEVICE LETTERS, 1998, 19 (07) : 228 - 230
  • [50] Trench型N-Channel MOSFET低剂量率效应研究
    徐海铭
    唐新宇
    徐政
    廖远宝
    张庆东
    谢儒彬
    洪根深
    微电子学与计算机, 2024, 41 (05) : 134 - 139