共 50 条
- [41] DETERMINATION OF CRYSTALLOGRAPHIC POLARITY OF SINGLE CRYSTALS IN AN X-RAY FLUORESCENCE SPECTROMETER INDUSTRIAL LABORATORY, 1967, 33 (02): : 193 - &
- [42] COMBINED X-RAY SPECTROMETER FOR MEASURING DEFORMATION IN SINGLE CRYSTALS. Instruments and Experimental Techniques (English Translation of Pribory I Tekhnika Eksperimenta), 1975, 18 (2 pt 2): : 594 - 596
- [43] X-RAY SPECTROMETER FOR EXAMINING STRUCTURAL DEFECTS IN SINGLE CRYSTALS. Instruments and experimental techniques New York, 1981, 24 (1 pt 2): : 240 - 242
- [45] The X-Ray Microcalorimeter Spectrometer for the International X-Ray Observatory LOW TEMPERATURE DETECTORS LTD 13, 2009, 1185 : 757 - +
- [47] GERMANIUM X-RAY SPECTROMETER INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1979, 22 (05) : 1254 - 1256