EXAFS AT GRAZING-INCIDENCE - DATA-COLLECTION AND ANALYSIS

被引：27
|
作者：
HEALD, SM
机构：
[1] Brookhaven National Laboratory, Upton
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1992年 / 63卷 / 01期
关键词：
D O I：
10.1063/1.1142632
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Extended x-ray absorption fine structure (EXAFS) at grazing incidence can be applied to a large variety of surface and interface problems. This paper discusses in detail the collection and analysis of such data using interface EXAFS from metal/Al bilayers as an example. A comparison of the fluorescence and reflectivity detection channels is given, along with a discussion of the methods for correction of anomalous dispersion distortions. In addition, data from a Ni-Ti multilayer is used to demonstrate the potential of enhancing the sensitivity of the EXAFS signal to selected regions using standing wave effects.
引用
收藏
页码：873 / 878
页数：6
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