USE OF POLARIZED X RADIATION TO SEPARATE EFFECTS OF TRUE SMALL-ANGLE SCATTERING AND DOUBLE BRAGG REFLECTIONS

被引：0
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作者：
ROVINSKI.BM
SINAISKI.VM
BRITAN, IM
机构：
来源：
SOVIET PHYSICS CRYSTALLOGRAPHY, USSR | 1971年 / 15卷 / 04期
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中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
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页码：725 / &
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