MODELING OF EMBEDDED FATIGUE CRACKS IN RAILROAD RAILS

被引：5
|
作者：
RICE, RC
RUNGTA, R
机构：
来源：
FATIGUE & FRACTURE OF ENGINEERING MATERIALS & STRUCTURES | 1988年 / 11卷 / 03期
关键词：
D O I：
10.1111/j.1460-2695.1988.tb01172.x
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
引用
收藏
页码：189 / 203
页数：15
相关论文
共 50 条
  • [21] A branch criterion for shallow angled rolling contact fatigue cracks in rails
    Wong, SL
    Bold, PE
    Brown, MW
    Allen, RJ
    WEAR, 1996, 191 (1-2) : 45 - 53
  • [22] IMPROVING THE QUALITY OF RAILROAD RAILS
    PALYANICHKA, VA
    VINOKUROV, IY
    EVDOKIMOV, AV
    GORDIENKO, MS
    ROZTORGUEV, VD
    LEVCHENKO, NF
    METALLURGIST, 1978, 22 (5-6) : 310 - 312
  • [23] IMPROVING THE QUALITY OF RAILROAD RAILS
    PALYANICHKA, VA
    GORDIENKO, MS
    VISTOROVSKII, NT
    MELEKOV, VA
    PLOKHIKH, VA
    METALLURGIST, 1988, 32 (7-8) : 232 - 233
  • [24] Fatigue analysis on offshore pipelines with embedded cracks
    Zhang, Y. M.
    Fan, M.
    Xiao, Z. M.
    Zhang, W. G.
    OCEAN ENGINEERING, 2016, 117 : 45 - 56
  • [25] WELDING OF RAILROAD RAILS.
    Sato, Yukihiko
    Morishige, Eiji
    Ueda, Masahiro
    Takizawa, Fumio
    Nagahashi, Shinichi
    Nishi, Yasuhiko
    Nippon Kokan technical report overseas, 1986, (47): : 72 - 76
  • [26] IMPROVEMENT IN THE QUALITY OF RAILROAD RAILS
    PALYANICHKA, VA
    PAN, AV
    GORDIENKO, MS
    MELEKOV, VA
    GAKHELADZE, GS
    METALLURGIST, 1988, 32 (3-4) : 117 - 118
  • [27] WELDING OF RAILROAD RAILS.
    Nakata, Mitsunori
    Tamura, Yooichi
    Nomura, Hirokazu
    Ueda, Masahiro
    Watanabe, Yuusaku
    Mori, Saburo
    Nippon Kokan technical report overseas, 1981, (32): : 34 - 46
  • [28] The morphology of cracks in rails
    Hobbs, J.
    Lim, T.
    Fletcher, D.
    Kapoor, A.
    ESIA8: THROUGHLIFE MANAGEMENT OF STRUCTURES AND COMPONENTS, 2006, : 45 - +
  • [29] shatter cracks in rails
    不详
    JOURNAL OF THE FRANKLIN INSTITUTE, 1934, 218 : 102 - 102
  • [30] Characterization of Rolling Contact Fatigue Cracks in Rails by Eddy Current Pulsed Thermography
    Zhu, Junzhen
    Withers, Philip John
    Wu, Jianbo
    Liu, Feng
    Yi, Qiuji
    Wang, Zijun
    Tian, Gui Yun
    IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 2021, 17 (04) : 2307 - 2315
12345