OFF-SPECULAR REFLECTION FROM FLAT INTERFACES

被引:12
|
作者
WU, WL
机构
[1] Polymers Division, Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg
来源
JOURNAL OF CHEMICAL PHYSICS | 1994年 / 101卷 / 05期
关键词
D O I
10.1063/1.468464
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The reflection of x ray or neutron from a flat interface with density or compositional fluctuations was studied. An integral equation relating the reflection intensities to the interfacial fluctuations was derived in the Fraunhofer limit. At the specular condition this integral equation, although derived for the off-specular intensities, has an expression identical to a well-established one for the specular component. This integral equation was applied to a flat surface onto which gold spheres of uniform size M;ere randomly adhered. The out-of-plane components for both the real wave and the time reversed wave were approximated by the solution from the specular component. Based on the calculated off-specular intensities near the specular region, an approximation scheme was proposed to estimate the in-plane correlation length.
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页码:4198 / 4204
页数:7
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