SIMPLE SYSTEM FOR INSPECTION OF MICROELECTROPHORETIC PATTERNS

被引:0
|
作者
BACCELLIERE, L
CUPELLO, A
HULTBORN, R
机构
[1] OSPEDALE S MARTINO,CNR,CTR NEUROFISIOL,GENOVA,ITALY
[2] UNIV GOTHENBURG,INST NEUROBIOL,S-40033 GOTHENBURG 33,SWEDEN
来源
EXPERIENTIA | 1977年 / 33卷 / 03期
关键词
D O I
10.1007/BF02002853
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
引用
收藏
页码:402 / 403
页数:2
相关论文
共 50 条
  • [41] Simple Patterns in Nuclei
    Dreyfuss, A. C.
    Draayer, J. P.
    Launey, K. D.
    Dytrych, T.
    Bakers, R. B.
    FISSION AND PROPERTIES OF NEUTRON-RICH NUCLEI, 2018, : 321 - 330
  • [42] Simple Strophic Patterns
    Wilhelm, Raymund
    ZEITSCHRIFT FUR ROMANISCHE PHILOLOGIE, 2013, 129 (04): : 1052 - 1055
  • [43] An automated inspection system
    Prieto, F
    Redarce, T
    Lepage, R
    Boulanger, P
    INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2002, 19 (12): : 917 - 925
  • [44] AUTOMATED INSPECTION SYSTEM
    不详
    MATERIALS EVALUATION, 2023, 81 (03) : 12 - 12
  • [45] TRACE INSPECTION SYSTEM
    LOWE, D
    GUERIN, HV
    POLICE CHIEF, 1977, 44 (01): : 30 - 32
  • [46] PHOTOMASK INSPECTION SYSTEM
    不详
    SOLID STATE TECHNOLOGY, 1985, 28 (04) : 109 - 110
  • [47] Intelligent Inspection System
    May, J
    Dale, K
    Holloway, M
    Gaby, W
    OPEN ARCHITECTURE CONTROL SYSTEMS AND STANDARDS, 1997, 2912 : 177 - 183
  • [48] Blade Inspection System
    Chen, Tian
    APPLIED MATERIALS AND TECHNOLOGIES FOR MODERN MANUFACTURING, PTS 1-4, 2013, 423-426 : 2386 - 2389
  • [49] Microscope inspection system
    不详
    PLASTICS ENGINEERING, 2007, 63 (09) : 66 - 66
  • [50] Stemware inspection system
    Sacha, JP
    Luster, S
    Shabestari, BN
    Miller, JWV
    Sena, M
    MACHINE VISION SYSTEMS FOR INSPECTION AND METROLOGY VIII, 1999, 3836 : 209 - 215