RA SYSTEM USING PROCESS FAILURE ANALYSIS FOR ICS

被引：0
|
作者：
TAKAIDE, A
MANABE, N
机构：
[1] NIPPON ELECT CO,DIV INTEGRATED CIRCUIT,DEPT RELIABIL & QUAL CONTROL,RELIABIL ENGN SECT,KAWASKI,KANAGAWA 211,JAPAN
[2] NIPPON ELECT CO,NAKAHARA KU,KAWASKI,KANAGAWA 211,JAPAN
来源：
PROCEEDINGS ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM | 1977年 / NSYM期
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D O I：
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中图分类号：
T [工业技术];
学科分类号：
08 ;
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页码：1 / 6
页数：6
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