BAND OFFSETS FOR THE SILICON-NITRIDE AMORPHOUS-SILICON INTERFACE - IMPLICATIONS FOR CHARGE TRANSPORT AND TRAPPING IN SILICON-NITRIDE

被引:9
|
作者
JACKSON, WB
MOYER, MD
TSAI, CC
MARSHALL, J
机构
关键词
D O I
10.1016/0022-3093(87)90214-6
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
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页码:891 / 894
页数:4
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