EXPRESS METHOD OF DETERMINING PLATING THICKNESS

被引:0
|
作者
KOTIK, FI
KOCHEREZ.EI
机构
来源
INDUSTRIAL LABORATORY | 1968年 / 34卷 / 02期
关键词
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:243 / &
相关论文
共 50 条
  • [31] OPTICAL METHOD OF DETERMINING THICKNESS OF GEIGER TUBE WINDOWS
    BROWN, FW
    WILLOUGHBY, AB
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1948, 19 (11): : 820 - 821
  • [32] A METHOD FOR DETERMINING OPTICAL CONSTANTS AND THICKNESS OF DIELECTRIC FILMS
    GISIN, MA
    KONYUKHO.GP
    NESMELOV, EA
    OPTICS AND SPECTROSCOPY-USSR, 1969, 26 (02): : 162 - &
  • [33] A RADIOLOGIC METHOD FOR DETERMINING THE THICKNESS OF THE HARD CROWN TISSUES
    SCOTTI, R
    VILLA, L
    CAROSSA, S
    JOURNAL OF PROSTHETIC DENTISTRY, 1989, 62 (06): : 633 - 637
  • [34] METHOD OF DETERMINING THICKNESS OF BROKEN LAYER ON SURFACE OF QUARTZ
    DARYMOV, VI
    KOSHELEV, FP
    KRIVOBOKOV, VP
    KURIN, MN
    INDUSTRIAL LABORATORY, 1978, 44 (03): : 355 - 356
  • [35] Spectroscopic method for determining thickness of quartz wave plate
    Feng, Weiwei
    Lin, Lihuang
    Chen, Ligang
    Zhu, Huafeng
    Li, Ruxin
    Xu, Zhizhan
    Chinese Optics Letters, 2006, 4 (12) : 705 - 708
  • [36] A spectroscopic method for determining thickness of quartz wave plate
    冯伟伟
    林礼煌
    陈立刚
    朱化凤
    李儒新
    徐至展
    Chinese Optics Letters, 2006, (12) : 705 - 708
  • [37] A new method for determining the undeformed chip thickness in milling
    Li, HZ
    Liu, K
    Li, XP
    JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, 2001, 113 (1-3) : 378 - 384
  • [38] A method of determining the thickness of liquid-liquid interfaces
    Yang, C
    Li, DQ
    COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS, 1996, 113 (1-2) : 51 - 59
  • [39] DETERMINING THICKNESS OF COATINGS BY GAMMA-ELECTRON METHOD
    STARCHIK, LP
    YUZHNYI, OV
    INDUSTRIAL LABORATORY, 1969, 35 (04): : 562 - &
  • [40] RAPID METHOD OF DETERMINING THE THICKNESS OF THIN STRENGTHENING COATINGS
    KOVALEVSKII, VV
    ZUBKOV, LE
    SHALAPKO, YI
    INDUSTRIAL LABORATORY, 1993, 59 (04): : 435 - 437