SYSTEMS-APPROACH TO QUALITY-CONTROL

被引：0
|
作者：
KLEIN, CM [1 ]
YERALAN, S [1 ]
机构：
[1] UNIV FLORIDA,DEPT IND & SYST ENGN,GAINESVILLE,FL 32611
来源：
INTERNATIONAL JOURNAL OF SYSTEMS SCIENCE | 1990年 / 21卷 / 12期
关键词：
Inspection;
D O I：
10.1080/00207729008910578
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
The quality of a product has become an essential component in today's international market-place. In manufacturing systems operating under a ‘no-defects’ quality-control policy, locating the origin of any imperfections must be implemented by placing several inspection stations within the production process. In this paper an aggregate manufacturing-inspection system model which represents a no-defects control policy is presented. The model can be used to qualitatively predict the effect of inspection on product quality under several different system configurations and hence can be used as a design tool as well as a quality-control tool. © 1990 Taylor & Francis Group, LLC.
引用
收藏
页码：2653 / 2662
页数：10
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