Degradation of instrumentation amplifiers due to the Nonionizing energy loss damage

被引：2

作者：

Franco, FJ ^{[1
]}

Lozano, J ^{[1
]}

Santos, JP ^{[1
]}

Agapito, JA ^{[1
]}

机构：

[1] Univ Complutense Madrid, Fac Ciencias Fis, Dept Fis Aplicada 3, E-28040 Madrid, Spain

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2003年 / 50卷 / 06期

关键词：

COTS; displacement damage; instrumentation amplifiers; neutron tolerance; operational amplifiers;

D O I：

10.1109/TNS.2003.820628

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Tests on instrumentation amplifiers exposed to neutron radiation have been done. The tested devices were commercial instrumentation amplifiers or designed with rad-tol commercial operational amplifiers. The results show changes in frequency behavior, gain, offset voltage, output saturation voltages, and quiescent current. The radiation tolerance is bigger in amplifiers with JFET input stage or with large frequency bandwidth and is smaller if the amplifier has been designed for reducing the power consumption. The IAs built with OPAMPs have a higher tolerance than the commercial ones, but they have disadvantages: high temperature influence, low CMRR, etc.

引用

页码：2433 / 2440

页数：8

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