VARIATIONAL APPROACH TO NON-LINEAR IMPURITY SCREENING IN SEMICONDUCTORS

被引：0

作者：

CSAVINSZKY, P ^{[1
]}

BROWNSTEIN, KR ^{[1
]}

机构：

[1] UNIV MAINE,ORONO,ME 04473

来源：

BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1981年 / 26卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：317 / 317

页数：1

共 50 条

[1] NON-LINEAR IMPURITY SCREENING IN SEMICONDUCTORS
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