X-RAY PHOTOELECTRON DIFFRACTION WITH HIGH ANGULAR RESOLUTION

被引：2
|
作者：
OSTERWALDER, J
STEWART, E
SAIKI, R
CYR, D
FADLEY, CS
机构：
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 04期
关键词：
D O I：
10.1116/1.574371
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：661 / 663
页数：3
相关论文
共 50 条
  • [41] High-resolution scanning x-ray diffraction microscopy
    Thibault, Pierre
    Dierolf, Martin
    Menzel, Andreas
    Bunk, Oliver
    David, Christian
    Pfeiffer, Franz
    SCIENCE, 2008, 321 (5887) : 379 - 382
  • [42] High-resolution X-ray diffraction from microstructures
    Chrosch, J
    Salje, EKH
    FERROELECTRICS, 1997, 194 (1-4) : 149 - 159
  • [43] High-resolution X-ray diffraction datasets: Carbonates
    Amao, Abduljamiu O.
    Al-Otaibi, Bandar
    Al-Ramadan, Khalid
    DATA IN BRIEF, 2022, 42
  • [44] Microbeam x-ray standing wave and high resolution diffraction
    Kazimirov, A
    Bilderback, DH
    Huang, R
    Sirenko, A
    SYNCHROTRON RADIATION INSTRUMENTATION, 2004, 705 : 1027 - 1030
  • [45] High-resolution X-ray diffraction from microstructures
    Univ of Cambridge, Cambridge, United Kingdom
    Ferroelectrics, 1-4 (149-159):
  • [46] High resolution X-ray diffraction experiments for selected minerals
    Stachowicz, Marcin
    Malinska, Maura
    Parafiniuk, Jan
    Wozniak, Krzysztof
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2010, 66 : S193 - S193
  • [47] Depth profiling of GaN by High Resolution X-ray diffraction
    Romanitan, C.
    2019 INTERNATIONAL SEMICONDUCTOR CONFERENCE (CAS 2019), 42ND EDITION, 2019, : 173 - 176
  • [48] High-resolution X-ray diffraction with no sample preparation
    Hansford, G. M.
    Turner, S. M. R.
    Degryse, P.
    Shortland, A. J.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2017, 73 : 293 - 311
  • [49] Diffractive-refractive X-ray optics for very high angular resolution X-ray astronomy
    Gorenstein, Paul
    ADVANCES IN SPACE RESEARCH, 2007, 40 (08) : 1276 - 1280
  • [50] THE EFFECTS OF PHOTOELECTRON DIFFRACTION ON QUANTITATIVE X-RAY PHOTOELECTRON-SPECTROSCOPY
    BISHOP, HE
    SURFACE AND INTERFACE ANALYSIS, 1991, 17 (04) : 197 - 202
12345