COMPUTER-SIMULATION OF SEM ELECTRON-BEAM INDUCED CURRENT IMAGES OF DISLOCATIONS AND STACKING-FAULTS

被引：44

作者：

DONOLATO, C

KLANN, H

机构：

[1] Max-Planck-Institut für Festkörperforschung, 7000 Stuttgart 80, Germany

来源：

JOURNAL OF APPLIED PHYSICS | 1980年 / 51卷 / 03期

关键词：

D O I：

10.1063/1.327767

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1624 / 1633

页数：10

共 50 条

[1] COMPUTER-SIMULATION OF VACANCY LOOPS AND STACKING-FAULTS IN ZIRCONIUM
KAPINOS, VG
OSETSKY, YN
PLATONOV, PA
JOURNAL OF NUCLEAR MATERIALS, 1992, 195 (1-2) : 83 - 101
[2] DEVELOPMENTS IN COMPUTER-SIMULATION OF X-RAY-DIFFRACTION CONTRAST IMAGES OF STACKING-FAULTS
KOWALSKI, G
LANG, AR
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1986, 19 : 224 - 228
[3] COMPUTER-SIMULATION OF X-RAY-DIFFRACTION TOPOGRAPHS OF STACKING-FAULTS
WONSIEWICZ, BC
PATEL, JR
JOURNAL OF APPLIED PHYSICS, 1976, 47 (05) : 1837 - 1845
[4] COMPUTER-SIMULATION OF X-RAY TOPOGRAPHS OF STACKING-FAULTS IN SILICON
WONSIEWICZ, BC
PATEL, JR
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1975, 8 (FEB1) : 67 - 68
[5] CONVERGENT-BEAM ELECTRON-DIFFRACTION STUDY OF TRANSVERSE STACKING-FAULTS AND DISLOCATIONS
FUNG, KK
ULTRAMICROSCOPY, 1985, 17 (02) : 81 - 85
[6] COMPUTER-SIMULATION OF ELECTRON-BEAM ANNEALING OF SILICON
MERLI, PG
OPTIK, 1980, 56 (03): : 205 - 222
[7] COMPUTER-SIMULATION OF ELECTRON-BEAM RESIST PROFILES
KYSER, DF
PYLE, R
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1980, 24 (04) : 426 - 437
[8] COMPUTER-SIMULATION OF ELECTRON-BEAM INDUCED CURRENT (EBIC) LINESCANS ACROSS PN-JUNCTIONS
MARTEN, HW
HILDEBRAND, O
SCANNING ELECTRON MICROSCOPY, 1983, : 1197 - 1209
[9] COMPUTER-SIMULATION OF POLYETHYLENE CRYSTALS .2. THE BOUNDARY PROPERTIES OF TWINS AND STACKING-FAULTS
GEARY, NA
BACON, DJ
JOURNAL OF MATERIALS SCIENCE, 1983, 18 (03) : 864 - 883
[10] ELECTRON-BEAM INDUCED CURRENT AND CATHODOLUMINESCENCE STUDY OF THE RECOMBINATION ACTIVITY OF STACKING-FAULTS AND HILLOCKS IN HYDRIDE VAPOR-PHASE EPITAXY INP
ATTOLINI, G
FRIGERI, C
PELOSI, C
SALVIATI, G
APPLIED PHYSICS LETTERS, 1986, 49 (03) : 167 - 169

← 1 2 3 4 5 →