MINICOMPUTER-BASED TEST SYSTEM FOR ANALYZING THE ELECTRONIC COMPONENTS OF A LARGE-SCALE SCIENTIFIC-RESEARCH INSTRUMENT

被引：0
|
作者：
PECINA, RJ
TRAVIS, DJ
GUERCIO, JS
HEDTKE, PA
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1981年 / 52卷 / 06期
关键词：
D O I：
10.1063/1.1136690
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：915 / 921
页数：7
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