X-RAY DETERMINATION OF THE THICKNESS OF THIN-FILMS OF TIC, TIN, TI(N,C)

被引：1
|
作者：
NEUMANN, J
HEJDOVA, H
CERMAK, M
机构：
来源：
CZECHOSLOVAK JOURNAL OF PHYSICS | 1989年 / 39卷 / 01期
关键词：
D O I：
10.1007/BF01597438
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：80 / 89
页数：10
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