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- [1] INFLUENCE OF THE STRUCTURE OF INP THIN-FILMS ON ELECTRON-ENERGY LOSS SPECTRACRYSTAL RESEARCH AND TECHNOLOGY, 1989, 24 (02) : 149 - 152GRUNDLER, RBOUDRIOT, HDEUS, KSCKNEIDER, HASTOCKERT, T
- [2] INFLUENCE OF FILM STRUCTURE ON THE ELECTRON-ENERGY LOSS SPECTRA OF GAAS THIN-FILMSCRYSTAL RESEARCH AND TECHNOLOGY, 1983, 18 (08) : 1035 - 1044BOUDRIOT, HKUBIER, BDEUS, KGRUNDLER, RKUSIOR, E
- [3] STRUCTURAL CHARACTERIZATION OF TRANSPARENT SEMICONDUCTING THIN-FILMS OF SNO2 AND IN2O3THIN SOLID FILMS, 1981, 85 (3-4) : 355 - 359MAMMANA, APBRAGA, ESTORRIANI, IANDERSON, RL
- [4] OXYGEN SENSORS USING IN2O3/SNO2 THIN-FILMSJOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (08) : C338 - C338MASI, JV
- [5] AUGER AND ELECTRON-ENERGY LOSS SPECTROSCOPY STUDIES OF AIN AND (AIN)X(AL2O3)1-X THIN-FILMSJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1992, 10 (01): : 137 - 144SHINAR, R
- [6] OPTICAL-PROPERTIES OF ZNSIAS2 SINGLE CRYSTALLINE THIN-FILMS FROM ELECTRON-ENERGY LOSS MEASUREMENTSPHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1987, 143 (02): : K125 - K130BOUDRIOT, HDEUS, KGRUNDLER, RSCHNEIDER, HASTOCKERT, T
- [7] FIELD-EFFECT DEVICES USING EVAPORATED IN2O3 THIN-FILMS ON FERROELECTRIC CERAMICSFERROELECTRICS, 1978, 19 (3-4) : 167 - 167NAGATOMO, TOMOTO, O
- [8] CHARACTERIZATION AND CRYSTALLITE GROWTH OF SEMICONDUCTING HIGH-TEMPERATURE-STABLE GA2O3 THIN-FILMSJOURNAL OF MATERIALS SCIENCE LETTERS, 1992, 11 (24) : 1728 - 1731FLEISCHER, MMEIXNER, H
- [9] CLASSIFICATION OF Y2O3 AND CEO2 IN THIN-FILMS USING ENERGY-LOSS SPECTROSCOPY IN STEMJOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1985, 10 (02): : A23 - A23GASGNIER, MBROWN, LM
- [10] ELECTRON-ENERGY SPECTRUM ACCOMPANYING THE PASSAGE OF FISSION FRAGMENTS THROUGH THIN AL2O3 FILMSSOVIET ATOMIC ENERGY, 1987, 63 (01): : 539 - 544RYKOV, VADYACHENKO, PPKOSHELEV, AA