IMPROVEMENT OF ALPHA-PARTICLE-INDUCED SOFT-ERROR IMMUNITY IN A GAAS SRAM BY A BURIED P-LAYER

被引：18
|
作者：
UMEMOTO, Y [1 ]
MASUDA, N [1 ]
SHIGETA, J [1 ]
MITSUSADA, K [1 ]
机构：
[1] HITACHI LTD,DEVICE DEV CTR,GAAS IC GRP,KODAIRA,TOKYO 187,JAPAN
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1988年 / 35卷 / 03期
关键词：
D O I：
10.1109/16.2450
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：268 / 274
页数：7
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