HIGH-SPEED ELECTRON-BEAM ANNEALING OF ARSENIC AND GALLIUM IMPLANTED SILICON

被引:4
|
作者
KLABES, R
GROTZSCHEL, R
VOELSKOW, M
PANZER, S
BARTSCH, H
机构
[1] INST MANFRED VON ARDENNE,DRESDEN,GER DEM REP
[2] AKAD WISSENSCH DDR,INST FESTKORPERPHYS & ELEKTRONENMIKROSKOPIE,DDR-402 HALLE,GER DEM REP
来源
关键词
D O I
10.1002/pssa.2210640164
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:K73 / K75
页数:3
相关论文
共 50 条
  • [21] A HIGH-SPEED ELECTRON-BEAM LITHOGRAPHY SYSTEM
    EIDSON, JC
    SCUDDER, RK
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (04): : 932 - 935
  • [22] HIGH-SPEED ELECTRON-BEAM PATTERN GENERATION
    VARNELL, GL
    SPICER, DF
    RODGER, AC
    HOLLAND, RD
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1974, 121 (03) : C109 - C109
  • [23] KINETICS OF SCANNED ELECTRON-BEAM ANNEALING OF HIGH-ENERGY AS ION-IMPLANTED SILICON
    KRIMMEL, EF
    OPPOLZER, H
    RUNGE, H
    WONDRAK, W
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1981, 66 (02): : 565 - 571
  • [24] ANNEALING OF IN IMPLANTED GERMANIUM BY PULSED ELECTRON-BEAM
    LAUGIER, A
    BARBIER, D
    CACHARD, A
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 209 (MAY): : 701 - 705
  • [25] Effect of ionization on the behavior of silicon in gallium arsenide subjected to electron-beam annealing
    Ardyshev, MV
    Ardyshev, VM
    SEMICONDUCTORS, 2002, 36 (02) : 157 - 159
  • [26] MULTI-SCANNING ELECTRON-BEAM ANNEALING OF PHOSPHORUS-IMPLANTED SILICON
    BENTINI, GG
    GALLONI, R
    NIPOTI, R
    APPLIED PHYSICS LETTERS, 1980, 36 (08) : 661 - 663
  • [27] Effect of ionization on the behavior of silicon in gallium arsenide subjected to electron-beam annealing
    M. V. Ardyshev
    V. M. Ardyshev
    Semiconductors, 2002, 36 : 157 - 159
  • [28] A COMPARISON OF ELECTRON GUNS FOR HIGH-SPEED ELECTRON-BEAM INSPECTION
    ORLOFF, J
    SCANNING ELECTRON MICROSCOPY, 1984, : 1585 - 1600
  • [29] ELECTRON-BEAM ANNEALING FOR PHOSPHORUS AND ARSENIC IMPLANTATION
    ZHENG, LR
    CHEN, J
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 6 (1-2): : 321 - 324
  • [30] PULSED ELECTRON-BEAM FOR SILICON ANNEALING
    LEGGIERI, G
    LUCHES, A
    NASSISI, V
    PERRONE, A
    PERRONE, MR
    MAJNI, G
    NAVA, F
    VACUUM, 1982, 32 (01) : 9 - 10