TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROSCOPY FOR IN-SITU, REAL-TIME ANALYSIS OF GROWING FILMS

被引：7
|
作者：
ROBERTS, TA
GRAY, KE
机构：
[1] ARGONNE NATL LAB,DIV MAT SCI,ARGONNE,IL 60439
[2] CTR NAVAL ANAL,ALEXANDRIA,VA
来源：
MRS BULLETIN | 1995年 / 20卷 / 05期
关键词：
D O I：
10.1557/S0883769400044882
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：43 / 46
页数：4
相关论文
共 50 条
  • [31] DETERMINATION OF TRACE-ELEMENTS IN RAINWATER BY TOTAL-REFLECTION X-RAY-FLUORESCENCE
    STOSSEL, RP
    PRANGE, A
    ANALYTICAL CHEMISTRY, 1985, 57 (14) : 2880 - 2885
  • [32] BORON-NITRIDE SAMPLE CARRIERS FOR TOTAL-REFLECTION X-RAY-FLUORESCENCE
    PRANGE, A
    KRAMER, K
    REUS, U
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1993, 48 (02) : 153 - 161
  • [33] TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROSCOPY USING SYNCHROTRON-RADIATION FOR WAFER SURFACE TRACE IMPURITY ANALYSIS
    PIANETTA, P
    TAKAURA, N
    BRENNAN, S
    TOMPKINS, W
    LADERMAN, SS
    FISCHERCOLBRIE, A
    SHIMAZAKI, A
    MIYAZAKI, K
    MADDEN, M
    WHERRY, DC
    KORTRIGHT, JB
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (02): : 1293 - 1297
  • [34] TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRIC DETERMINATION OF ELEMENTS IN NANOGRAM AMOUNTS
    WOBRAUSCHEK, P
    AIGINGER, H
    ANALYTICAL CHEMISTRY, 1975, 47 (06) : 852 - 855
  • [35] TRACE ANALYSIS OF GEOLOGICAL AND ENVIRONMENTAL-SAMPLES BY TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY
    MICHAELIS, W
    PRANGE, A
    NUCLEAR GEOPHYSICS, 1988, 2 (04): : 231 - 245
  • [36] TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS WITH SYNCHROTRON-RADIATION MONOCHROMATIZED BY MULTILAYER STRUCTURES
    RIEDER, R
    WOBRAUSCHEK, P
    LADISICH, W
    STRELI, C
    AIGINGER, H
    GARBE, S
    GAUL, G
    KNOCHEL, A
    LECHTENBERG, F
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1995, 355 (2-3): : 648 - 653
  • [37] APPLICATION OF X-RAY-FLUORESCENCE WITH TOTAL-REFLECTION SAMPLE CARRIER IN THE ANALYSIS OF SMALL ATMOSPHERIC SAMPLES
    HEIN, M
    HOFFMANN, P
    LIESER, KH
    FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1989, 333 (07): : 718 - 719
  • [38] Surface analysis by total-reflection X-ray fluorescence
    Sanchez, HJ
    Perez, CA
    Perez, RD
    Rubio, M
    RADIATION PHYSICS AND CHEMISTRY, 1996, 48 (03): : 325 - 331
  • [39] TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS OF LIGHT-ELEMENTS USING SYNCHROTRON-RADIATION
    STRELI, C
    WOBRAUSCHEK, P
    LADISICH, W
    RIEDER, R
    AIGINGER, H
    RYON, RW
    PIANETTA, P
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1994, 345 (02): : 399 - 403
  • [40] A NEW PARTICLE SAMPLING TECHNIQUE FOR DIRECT ANALYSIS USING TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY
    DIXKENS, J
    FISSAN, H
    DOSE, T
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1993, 48 (02) : 231 - 238
12345