STABILITY OF THE INTERFACE WALL IN OVERWRITE EXCHANGE-COUPLED MULTILAYER FILMS

被引：1
|
作者：
NAKAKI, Y
TOIDE, Y
KAWANO, Y
TOKUNAGA, T
FUKAMI, T
TSUTSUMI, K
机构：
[1] Materials and Electronic Devices Laboratory, Mitsubishi Electric Corporation, Amagasaki, Hyogo
来源：
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1992年 / 117卷 / 1-2期
关键词：
D O I：
10.1016/0304-8853(92)90322-F
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The stability of recorded bits with an interface magnetic wall in the overwrite exchange-coupled magneto-optical films was studied. The wall energy of the recorded bits was increased by the existence of the interface magnetic wall and the recorded bits were made unstable, compared to the conventional ones. However optimization of the coercivity and the interface wall energy of the memory layer prevented the recorded bits from being unstable. It was found that the recorded bits in the overwrite exchange-coupled multilayer films were stable in the storage environment for practical use.
引用
收藏
页码：287 / 293
页数：7
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