ACCURATE GAUSSIAN LASER-BEAM DIAMETER MEASUREMENT USING EXPONENTIAL AND RECTIFIED SINUSOIDAL RULINGS

被引：3
|
作者：
CHERRI, AK
AWWAL, AAS
机构：
[1] Department of Electrical and Computer Engineering, University of Michigan, Dearborn, Michigan
[2] Computer Science and Engineering Department, Wright State University, Dayton, Ohio
来源：
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 1992年 / 5卷 / 06期
关键词：
GRATING; LASER BEAM DIAMETER MEASUREMENT; CONTACT SCREEN;
D O I：
10.1002/mop.4650050612
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Novel exponential and rectified sinusoidal gratings for the measurement of Gaussian laser beam diameter are proposed. It is found that these gratings provide accurate measurement for both small and large Gaussian beam diameters.
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页码：279 / 283
页数：5
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