CBE GROWTH OF ALGAAS/GAAS HETEROSTRUCTURES AND THEIR DEVICE APPLICATIONS

被引:22
|
作者
HOUNG, YM
机构
[1] Hewlett-Packard Laboratories, Palo Alto
关键词
D O I
10.1016/0022-0248(90)90350-T
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We demonstrate that the chemical beam epitaxial (CBE) technique is suitable for growing high quality AlGaAs/GaAs heterostructures for high-speed and photonic device applications. Substantial improvements in electrical and optical properties of AlxGa1-xAs were achieved using triisobutylaluminum (TIBAl) instead of triethylaluminum source. Highly uniform AlxGa1-xAs:Si and AlxGa1-xAs:C films with very low surface defect density were grown. The electrical and optical properties of these materials are comparable to those of high quality organometallic vapor phase epitaxial (OMVPE) AlxGa1-xAs. CBE grown 0.25 °m gate length modulation-doped field effect transistors (MODFET) have been fabricated. MODFETs having fT greater than 38 GHz and a 1.7 dB noise figure with 10 dB associated gain at 18 GHz are reported. Device quality AlGaAs/GaAs heterojunction bipolar transistor (HBT), electro-optic modulator and light emitter array structures grown by CBE technique were also demonstrated. © 1990.
引用
收藏
页码:124 / 134
页数:11
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