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- [1] Scanning force microscopy of latent heavy-ion tracks in ultrahigh vacuum MICRO/NANOTRIBOLOGY AND ITS APPLICATIONS, 1997, 330 : 261 - 267
- [2] SCANNING FORCE MICROSCOPY OF HEAVY-ION TRACKS RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1993, 126 (1-4): : 213 - 216
- [3] STUDY OF HEAVY-ION TRACKS IN CELLULOSE NITRATE (RUSSIAN) PLASTIC TRACK DETECTOR NUCLEAR TRACKS AND RADIATION MEASUREMENTS, 1988, 15 (1-4): : 195 - 197
- [4] Scanning force microscopy of heavy-ion tracks in lithium fluoride NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1998, 146 (1-4): : 393 - 398
- [6] Observation of latent heavy-ion tracks in polyimide by means of transmission electron microscopy Nucl Instrum Methods Phys Res Sect B, 1 (183-190):
- [7] OBSERVATION OF LATENT HEAVY-ION TRACKS IN GES BY TRANSMISSION ELECTRON-MICROSCOPY RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1993, 126 (1-4): : 275 - 278
- [8] Observation of latent heavy-ion tracks in polyimide by means of transmission electron microscopy NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1999, 156 (1-4): : 183 - 190
- [9] Scanning force microscopy corrected for nm-scale sample elasticity on single latent heavy-ion tracks in polymers EUROPHYSICS LETTERS, 2000, 50 (06): : 742 - 748
- [10] Scanning force microscopy on heavy-ion tracks in muscovite mica: track diameter versus energy loss and loading force APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S1151 - S1154