INVESTIGATION OF THE RADIATION-INDUCED CHANGES ON THE SURFACE-TOPOLOGY OF PVC FILMS BY ATOMIC-FORCE MICROSCOPY

被引：7

作者：

TAN, E ^{[1
]}

ALACAKIR, A ^{[1
]}

UZUN, C ^{[1
]}

GUVEN, O ^{[1
]}

机构：

[1] HACETTEPE UNIV,DEPT CHEM,ANKARA 06532,TURKEY

来源：

RADIATION PHYSICS AND CHEMISTRY | 1995年 / 46卷 / 4-6期

关键词：

ATOMIC FORCE MICROSCOPY; PVC; SURFACE TOPOLOGY; GAMMA IRRADIATION;

D O I：

10.1016/0969-806X(95)00287-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Surface analysis of polymers which are widely used in our daily life and many research areas, is of primary importance for better understanding of their stabilities against various external effects. Thus in conjunction with this, Atomic Force Microscopy (AFM) was used to determine the surface topology of the gamma irradiated poly(vinyl chloride) (PVC)films. The films prepared by solvent casting were irradiated with various doses up to 237 kGy by Co-60 gamma rays at a dose rate of 15 kGy/h at ambient temperature in air and vacuum. Three dimensional surface topological images of the films have been obtained by AFM for both unirradiated and irradiated samples.

引用

页码：897 / 900

页数：4

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