INVESTIGATION OF A FCC SURFACE USING ATOMIC-FORCE MICROSCOPY (AFM)

被引：0

作者：

OCCELLI, ML ^{[1
]}

GOULD, SAC ^{[1
]}

DRAKE, B ^{[1
]}

机构：

[1] GTRI,ATLANTA,GA 30332

来源：

ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1993年 / 206卷

关键词：

D O I：

暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：43 / PETR

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