ISOTOPE EFFECTS IN SECONDARY-ION EMISSION

被引：5
|
作者：
GNASER, H
机构：
来源：
RADIATION EFFECTS AND DEFECTS IN SOLIDS | 1989年 / 109卷 / 1-4期
关键词：
D O I：
10.1080/10420158908220542
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
引用
收藏
页码：265 / 271
页数：7
相关论文
共 50 条
  • [21] DETECTION OF LARGE MOLECULAR-IONS BY SECONDARY-ION AND SECONDARY-ELECTRON EMISSION
    VERENTCHIKOV, A
    ENS, W
    MARTENS, J
    STANDING, KG
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1993, 126 : 75 - 83
  • [22] EXIT CONDITIONS FOR SECONDARY-ION EMISSION INDUCED BY KEV CLUSTER BOMBARDMENT
    RAY, KB
    PARK, MA
    SCHWEIKERT, EA
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 82 (02): : 317 - 322
  • [23] The yield of secondary-ion emission from the surface of metals, semiconductors, and dielectrics
    Litvinov, VA
    Koval', AG
    Gritsaenko, SV
    JOURNAL OF COMMUNICATIONS TECHNOLOGY AND ELECTRONICS, 1998, 43 (10) : 1170 - 1176
  • [24] The influence of energy density inside the nuclear track on the secondary-ion emission
    Neugebauer, R
    Jalowy, T
    Pereira, JAM
    da Silveira, EF
    Rothard, H
    Toulemonde, M
    Groeneveld, KO
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2003, 209 : 62 - 67
  • [25] MECHANISM OF SECONDARY-ION EMISSION FROM SILICON DIOXIDE BOMBARDED WITH ARGON IONS
    TAMAKI, S
    YAMAUCHI, N
    KURODA, T
    YAGI, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (4A): : 1968 - 1971
  • [26] 2-charged ions in mass-spectra of secondary-ion emission
    Dorozhkin, AA
    Kovarskii, AP
    Filimonov, AV
    ZHURNAL TEKHNICHESKOI FIZIKI, 1996, 66 (01): : 195 - 198
  • [27] SECONDARY-ION EMISSION FROM PHENYLALANINE INDUCED BY ATOMIC AND MOLECULAR MEV ION-BEAMS
    LEITE, CVB
    DASILVEIRA, EF
    JERONYMO, JMF
    PINHO, RR
    BAPTISTA, GB
    SCHWEIKERT, EA
    PARK, MA
    PHYSICAL REVIEW B, 1992, 45 (21): : 12218 - 12221
  • [28] SECONDARY-ION EMISSION FROM FROZEN ALKANES AND BENZENE INDUCED BY MEV-ION IMPACT
    WAGNER, M
    WIEN, K
    CURDES, B
    HILF, ER
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 82 (02): : 362 - 378
  • [29] SECONDARY-ION EMISSION FROM PERFLUORINATED POLYETHERS USING MEGAELECTRONVOLT AND KILOELECTRONVOLT ION-BOMBARDMENT
    FELD, H
    LEUTE, A
    RADING, D
    BENNINGHOVEN, A
    CHIARELLI, MP
    HERCULES, DM
    ANALYTICAL CHEMISTRY, 1993, 65 (15) : 1947 - 1953
  • [30] SECONDARY-ION EMISSION FROM CLEAN AND OXIDIZED ALUMINUM AS A FUNCTION OF INCIDENT ION MASS AND ENERGY
    BLAUNER, PG
    WELLER, RA
    PHYSICAL REVIEW B, 1987, 35 (04): : 1492 - 1499
12345