PROBLEMS IN ELEMENTAL CONCENTRATION DEPTH PROFILING WITH AN ION MICROPROBE

被引：8
|
作者：
SCHILLING, JH
BUGER, PA
机构：
来源：
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1978年 / 26卷 / 02期
关键词：
D O I：
10.1016/0020-7381(78)80019-9
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
引用
收藏
页码：163 / 172
页数：10
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