MAGNETIC FIELD MEASUREMENTS IN SCANNING ELECTRON MICROSCOPE

被引：14
|
作者：
THORNLEY, RF
HUTCHISON, JD
机构：
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1969年 / MAG5卷 / 03期
关键词：
D O I：
10.1109/TMAG.1969.1066539
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：271 / +
页数：1
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