ABSOLUTE METHOD FOR DETERMINATION OF METALLIC FILM THICKNESS BY X-RAY-FLUORESCENCE

被引：11
|
作者：
VAZQUEZ, C [1 ]
DELEYT, DV [1 ]
RIVEROS, JA [1 ]
机构：
[1] UNIV NACL CORDOBA,FAC MATEMAT ASTRON & FIS,CORDOBA,ARGENTINA
来源：
X-RAY SPECTROMETRY | 1988年 / 17卷 / 02期
关键词：
D O I：
10.1002/xrs.1300170203
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
引用
收藏
页码：43 / 46
页数：4
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