ABSOLUTE METHOD FOR DETERMINATION OF METALLIC FILM THICKNESS BY X-RAY-FLUORESCENCE

被引：11

作者：

VAZQUEZ, C ^{[1
]}

DELEYT, DV ^{[1
]}

RIVEROS, JA ^{[1
]}

机构：

[1] UNIV NACL CORDOBA,FAC MATEMAT ASTRON & FIS,CORDOBA,ARGENTINA

来源：

X-RAY SPECTROMETRY | 1988年 / 17卷 / 02期

关键词：

D O I：

10.1002/xrs.1300170203

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：43 / 46

页数：4

共 50 条

[1] CONTRIBUTION TO DETERMINATION OF THIN-LAYER THICKNESS WITH X-RAY-FLUORESCENCE METHOD
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[9] AN X-RAY-FLUORESCENCE METHOD FOR GOLD DETERMINATION IN ORE SAMPLES
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