共 50 条
- [42] CHARACTERIZATION OF GESI LAYERS FORMED BY HIGH-DOSE GE IMPLANTATION INTO SI NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 101 (03): : 243 - 246
- [43] TEM AND RBS STUDIES OF EPITAXIAL COSI2 LAYERS FORMED BY HIGH-DOSE COBALT IMPLANTATION INTO SILICON MICROSCOPY OF SEMICONDUCTING MATERIALS 1989, 1989, 100 : 627 - 634
- [45] AES AND SIMS PROFILING OF BURIED SILICIDE LAYERS FORMED BY 6 MEV HIGH-DOSE NICKEL IMPLANTATION INTO SILICON FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1989, 333 (4-5): : 511 - 515
- [46] TEM AND RBS STUDIES OF EPITAXIAL COSI2 LAYERS FORMED BY HIGH-DOSE COBALT IMPLANTATION INTO SILICON INSTITUTE OF PHYSICS CONFERENCE SERIES, 1989, (100): : 627 - 634
- [47] Sureace modifications in silicon (100) due to antimony implantation PHYSICS AT SURFACES AND INTERFACES, 2003, : 171 - 176
- [48] Microscopic Examination of the Silicon Surface Subjected to High-Dose Silver Implantation Technical Physics, 2019, 64 : 195 - 202
- [50] IDENTIFICATION OF EOR DEFECTS DUE TO THE REGROWTH OF AMORPHOUS LAYERS CREATED BY ION-BOMBARDMENT NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1994, 84 (02): : 190 - 194