RADIATION EFFECTS ON FERROELECTRIC THIN-FILM MEMORIES - RETENTION FAILURE MECHANISMS

被引：196
|
作者：
SCOTT, JF
ARAUJO, CA
MEADOWS, HB
MCMILLAN, LD
SHAWABKEH, A
机构：
[1] UNIV COLORADO, DEPT ELECT ENGN, COLORADO SPRINGS, CO 80933 USA
[2] SYMETRIX CORP, COLORADO SPRINGS, CO 80949 USA
来源：
JOURNAL OF APPLIED PHYSICS | 1989年 / 66卷 / 03期
关键词：
D O I：
10.1063/1.344419
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：1444 / 1453
页数：10
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