INFLUENCE OF THE DETECTOR RESPONSE FUNCTION IN THE DETERMINATION OF CONCENTRATION DEPTH PROFILES FROM ANGLE-RESOLVED ELECTRON-SPECTROSCOPY

被引：3
|
作者：
VANVEEN, NJ
机构：
来源：
ANALYTICAL CHEMISTRY | 1987年 / 59卷 / 17期
关键词：
D O I：
10.1021/ac00144a018
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：2088 / 2091
页数：4
相关论文
共 47 条
  • [21] INFLUENCE OF ELECTRON-PHONON INTERACTIONS ON ANGLE-RESOLVED PHOTOELECTRON-SPECTRA FROM METALS
    MATZDORF, R
    MEISTER, G
    GOLDMANN, A
    [J]. SURFACE SCIENCE, 1993, 296 (02) : 241 - 250
  • [22] Aspects of electron-phonon self-energy revealed from angle-resolved photoemission spectroscopy
    Lee, W. S.
    Johnston, S.
    Devereaux, T. P.
    Shen, Z.-X.
    [J]. PHYSICAL REVIEW B, 2007, 75 (19)
  • [23] Development of angle-resolved spectroscopy system of electrons emitted from a surface with negative electron affinity state
    Ichihashi, Fumiaki
    Dong, Xinyu
    Inoue, Akito
    Kawaguchi, Takahiko
    Kuwahara, Makoto
    Ito, Takahiro
    Harada, Shunta
    Tagawa, Miho
    Ujihara, Toru
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2018, 89 (07):
  • [24] Observation of quantized subband states and evidence for surface electron accumulation in CdO from angle-resolved photoemission spectroscopy
    Piper, L. F. J.
    Colakerol, Leyla
    King, P. D. C.
    Schleife, A.
    Zuniga-Perez, J.
    Glans, Per-Anders
    Learmonth, Tim
    Federov, A.
    Veal, T. D.
    Fuchs, F.
    Munoz-Sanjose, V.
    Bechstedt, F.
    McConville, C. F.
    Smith, Kevin E.
    [J]. PHYSICAL REVIEW B, 2008, 78 (16)
  • [25] Evidence derived from angle-resolved electron spectroscopy for a new spectral series in the photoionization continuum of molecular oxygen
    Parr, AC
    West, JB
    Marr, CV
    Dehmer, JL
    [J]. JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1998, 31 (23) : 5161 - 5173
  • [26] RESTORATION OF THE DEPTH-CONCENTRATION PROFILE FROM THE ANGLE-RESOLVED RELATIVE INTENSITIES OF X-RAY PHOTOELECTRON-SPECTRA
    JISL, R
    [J]. SURFACE AND INTERFACE ANALYSIS, 1990, 15 (12) : 719 - 726
  • [27] Measuring concentration depth profiles at liquid surfaces: Comparing angle resolved X-ray photoelectron spectroscopy and neutral impact collision scattering spectroscopy
    Wang, Chuangye
    Andersson, Gunther G.
    [J]. SURFACE SCIENCE, 2011, 605 (9-10) : 889 - 897
  • [28] SmB6 electron-phonon coupling constant from time- and angle-resolved photoelectron spectroscopy
    Sterzi, A.
    Crepaldi, A.
    Cilento, F.
    Manzoni, G.
    Frantzeskakis, E.
    Zacchigna, M.
    van Heumen, E.
    Huang, Y. K.
    Golden, M. S.
    Parmigiani, F.
    [J]. PHYSICAL REVIEW B, 2016, 94 (08)
  • [29] Molar concentration-depth profiles at the solution surface of a cationic surfactant reconstructed with angle resolved X-ray photoelectron spectroscopy
    Wang, Chuangye
    Morgner, Harald
    [J]. APPLIED SURFACE SCIENCE, 2011, 257 (06) : 2291 - 2297
  • [30] Nondestructive Surface Depth Profiles from Angle-Resolved X-ray Photoelectron Spectroscopy Data Using the Maximum Entropy Method. I. A New Protocol
    Scorciapino, M. Andrea
    Navarra, Gabrielle
    Elsener, Bernhard
    Rossi, Antonella
    [J]. JOURNAL OF PHYSICAL CHEMISTRY C, 2009, 113 (51): : 21328 - 21337
12345