NON-DESTRUCTIVE EVALUATION OF MEDICAL IMPLANT DEVICES BY HOLOGRAPHIC-INTERFEROMETRY AND OPTICAL CORRELATION

被引：0
|
作者：
WAGNER, JW [1 ]
GUNTHER, B [1 ]
机构：
[1] UNIV CALIF DAVIS,DAVIS,CA 95616
来源：
MATERIALS EVALUATION | 1979年 / 37卷 / 13期
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：59 / 63
页数：5
相关论文
共 50 条
  • [21] HOLOGRAPHIC-INTERFEROMETRY .6. ASPECTS OF THE OPTIMIZATION OF EVALUATION
    KOHLER, H
    OPTIK, 1982, 62 (04): : 413 - 423
  • [22] THz Non-destructive Evaluation Using Correlation processing
    Henry, Sam
    Baiocchi, Orlando
    Zurk, Lisa
    2013 38TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ), 2013,
  • [23] BAND CONTRAST IN THE CORRELATION SPECKLE-PHOTOGRAPHY TECHNIQUE AND CORRELATION HOLOGRAPHIC-INTERFEROMETRY
    OSINTSEV, AV
    OSTROVSKII, YI
    PRESNYAKOV, YP
    SHCHEPINOV, VP
    ZHURNAL TEKHNICHESKOI FIZIKI, 1992, 62 (08): : 128 - 137
  • [24] OPTICAL INSPECTION OF METAL OBJECTS BY HOLOGRAPHIC-INTERFEROMETRY AND THERMOGRAPHY - A COMPARISON
    IKONEN, K
    PEIPONEN, KE
    ASAKURA, T
    OPTICS AND LASERS IN ENGINEERING, 1992, 16 (01) : 41 - 47
  • [25] Non-destructive evaluation of semiconductor package by electronic speckle pattern interferometry
    Koungsuk Kim
    Kisoo Kang
    Seungtack Jung
    Journal of Mechanical Science and Technology, 2005, 19 : 820 - 825
  • [26] Non-destructive evaluation of semiconductor package by electronic speckle pattern interferometry
    Kim, K
    Kang, K
    Jung, S
    JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY, 2005, 19 (03) : 820 - 825
  • [27] Electronic Speckle Pattern Interferometry techniques for non-destructive evaluation: a review
    Mujeeb, A.
    Nayar, V. U.
    Ravindran, V. R.
    INSIGHT, 2006, 48 (05) : 275 - 281
  • [28] NON-DESTRUCTIVE EVALUATION
    FAGENBAUM, J
    MECHANICAL ENGINEERING, 1982, 104 (05) : 28 - 40
  • [29] OPTICAL MICROSCOPIC WAVE-GUIDE APPARATUS FOR HOLOGRAPHIC-INTERFEROMETRY
    BONDAREV, LA
    GOLOVCHENKO, GS
    DUBROVIN, VF
    MIROVITSKII, DI
    SMYK, AF
    SOVIET JOURNAL OF NONDESTRUCTIVE TESTING-USSR, 1987, 23 (03): : 215 - 219
  • [30] Non-destructive evaluation of tomato based on optical scattering
    Katsumata, Toru
    Aizawa, Hiroaki
    Komuro, Shuji
    Ito, Shigeo
    Matsumoto, Takeshi
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2019, 90 (04):
12345