CEPAMAT MP 210 - SYSTEM FOR MEASURING CHARACTERISTIC VALUES OF PAPER WEBS ON PAPER MACHINES

被引：0
|
作者：
ECKERT, W [1 ]
HACKEL, I [1 ]
机构：
[1] SIEMENS AG,SYSTEMTECH ENTWICKLUNG,D-8520 ERLANGEN,FED REP GER
来源：
SIEMENS ZEITSCHRIFT | 1977年 / 51卷 / 05期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：381 / 386
页数：6
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