FORMATION OF VERY LARGE GOLD SUPERCLUSTERS (CLUSTERS OF CLUSTERS) AS SECONDARY IONS UP TO (AU13)55 BY SECONDARY ION MASS-SPECTROMETRY

被引：41

作者：

FELD, H

LEUTE, A

RADING, D

BENNINGHOVEN, A

SCHMID, G

机构：

[1] UNIV MUNSTER,INST PHYS,WILHELM KLEMM STR 10,W-4400 MUNSTER,GERMANY

[2] UNIV ESSEN GESAMTHSCH,INST ANORGAN CHEM,W-4300 ESSEN 1,GERMANY

来源：

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY | 1990年 / 112卷 / 22期

关键词：

D O I：

10.1021/ja00178a051

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

[No abstract available]

引用

页码：8166 / 8167

页数：2

共 50 条

[31] STATIC SECONDARY ION MASS-SPECTROMETRY OF SELF-ASSEMBLED ALKANETHIOL MONOLAYERS ON GOLD
TARLOV, MJ
NEWMAN, JG
LANGMUIR, 1992, 8 (05) : 1398 - 1405
[32] UTILIZATION OF ION-BEAMS OF CESIUM IN MASS-SPECTROMETRY OF SECONDARY IONS FOR THE STUDIES OF DIELECTRICS
KOVARSKII, AP
GUREVICH, GM
KOSTIKOV, YP
ZHURNAL TEKHNICHESKOI FIZIKI, 1979, 49 (10): : 2226 - 2229
[33] THE EFFECT OF A GLYCEROL MATRIX ON THE CLUSTER ION FORMATION FROM SALTS IN SECONDARY ION MASS-SPECTROMETRY
WONG, SS
ROLLGEN, FW
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1986, 70 (02): : 135 - 144
[34] ROLE OF ION ION RECOMBINATION FOR ALKALI CHLORIDE CLUSTER FORMATION IN LIQUID SECONDARY ION MASS-SPECTROMETRY
SUNNER, J
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 1993, 4 (05) : 410 - 418
[35] INSTRUMENTAL CONDITIONS OF SECONDARY ION MASS-SPECTROMETRY THAT AFFECT SENSITIVITY FOR OBSERVATION OF VERY HIGH MASSES
ABERTH, W
ANALYTICAL CHEMISTRY, 1986, 58 (06) : 1221 - 1225
[36] FORMATION OF METAL-CHELATES IN SECONDARY ION MASS-SPECTROMETRY - COMPARISONS WITH SOLUTION CHEMISTRY
DAY, RJ
UNGER, SE
COOKS, RG
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1979, 101 (02) : 499 - 501
[37] STATIC SECONDARY ION MASS-SPECTROMETRY OF SELF-ASSEMBLED ALKYL THIOL MONOLAYERS ON GOLD
TARLOV, MJ
NEWMAN, JG
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1992, 204 : 76 - COLL
[38] SECONDARY-ION MASS-SPECTROMETRY FOR CHARACTERIZING PHOTOPATTERNED, SELF-ASSEMBLED MONOLAYERS ON GOLD
FRISBIE, CD
WOLLMAN, EW
MARTIN, JR
WRIGHTON, MS
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1993, 11 (04): : 2368 - 2372
[39] EVIDENCE FOR RADICAL-ANION FORMATION DURING LIQUID SECONDARY ION MASS-SPECTROMETRY ANALYSIS OF OLIGONUCLEOTIDES AND SYNTHETIC OLIGOMERIC ANALOGS - A DECONVOLUTION ALGORITHM FOR MOLECULAR ION REGION CLUSTERS
LARAMEE, JA
ARBOGAST, B
DEINZER, ML
ANALYTICAL CHEMISTRY, 1989, 61 (19) : 2154 - 2160
[40] A STUDY OF SECONDARY IONIZATION MECHANISM FOR LIF ON AU BY TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY AND DIRECT RECOIL MEASUREMENTS
MOON, DW
KIM, YS
KIM, JH
KANG, HJ
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (02): : 190 - 194

← 1 2 3 4 5 →