AN X-RAY METHOD FOR MEASURING THE THICKNESS OF THIN CRYSTALLINE FILMS

被引：12
|
作者：
EISENSTEIN, A
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1946年 / 17卷 / 11期
关键词：
D O I：
10.1063/1.1707656
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：874 / 878
页数：5
相关论文
共 50 条
  • [21] A MEASURING DEVICE AND PROCEDURE FOR X-RAY FILMS
    ARUJA, E
    JOURNAL OF SCIENTIFIC INSTRUMENTS, 1963, 40 (05): : 263 - &
  • [22] Novel Method of Measuring the Thickness of Nanoscale Films Using Energy Dispersive X-Ray Spectroscopy Line Scan Profiles
    Kang, Min-Chul
    Oh, Jin-Su
    Song, Kyeong-Youn
    Lee, Hoo-Jeong
    Baik, Hionsuck
    Yang, Cheol-Woong
    ADVANCED MATERIALS INTERFACES, 2022, 9 (07):
  • [23] An x-ray fluorescence method for determining the average density of thin films
    Trushin, OS
    Bochkarev, VF
    Goryachev, AA
    Naumov, VV
    Lebedev, AA
    INDUSTRIAL LABORATORY, 2000, 66 (10): : 674 - 675
  • [24] Thickness measurement of thin films and multilayers using Fourier transform of X-ray reflectivity
    Tiwari, U
    Sharma, RK
    Sehgal, BK
    Goyal, A
    Sharma, BB
    Kumar, V
    PROCEEDINGS OF THE ELEVENTH INTERNATIONAL WORKSHOP ON THE PHYSICS OF SEMICONDUCTOR DEVICES, VOL 1 & 2, 2002, 4746 : 1014 - 1017
  • [25] NEW X-RAY TECHNIQUE FOR RELATIVE THICKNESS DETERMINATION OF THIN METAL-FILMS
    WEYERER, H
    ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 1972, 136 (3-4): : 282 - 295
  • [26] Thickness dependence of X-ray absorption and photoemission in Fe thin films on Si(001)
    Gao, XY
    Qi, DC
    Tan, SC
    Wee, ATS
    Yu, XJ
    Moser, HO
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2006, 151 (03) : 199 - 203
  • [27] Analysis of the thickness measurement of multilayer optical thin films with grazing incident X-ray
    Li, XQ
    Song, XW
    Qu, Y
    Li, M
    Zhang, XD
    THIRD INTERNATIONAL CONFERENCE ON THIN FILM PHYSICS AND APPLICATIONS, 1998, 3175 : 470 - 473
  • [28] X-ray diffraction from inhomogeneous thin films of nanometre thickness: modelling and experiment
    Bocquet, F
    Gergaud, P
    Thomas, O
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2003, 36 : 154 - 157
  • [29] X-ray diffraction and X-ray reflectivity applied to investigation of thin films
    Rafaja, D
    ADVANCES IN SOLID STATE PHYSICS 41, 2001, 41 : 275 - 286
  • [30] X-ray determination of the thickness of thin metal foils
    Block, Robert C.
    Geuther, Jeffrey A.
    Methe, Brian
    Barry, Devin P.
    Leinweber, Gregory
    JOURNAL OF X-RAY SCIENCE AND TECHNOLOGY, 2013, 21 (03) : 347 - 355
12345