AN X-RAY METHOD FOR MEASURING THE THICKNESS OF THIN CRYSTALLINE FILMS

被引：12
|
作者：
EISENSTEIN, A
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1946年 / 17卷 / 11期
关键词：
D O I：
10.1063/1.1707656
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
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页码：874 / 878
页数：5
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