HOLOGRAPHIC INTERFEROMETRY MEASUREMENT OF THERMAL REFRACTIVE-INDEX COEFFICIENT AND THERMAL-EXPANSION COEFFICIENT OF ND-YAG AND ND-YALO

被引：15
|
作者：
YOUNG, DD
WILLIAMSON, TL
NICHOLS, ER
JUNGLING, KC
机构：
来源：
IEEE JOURNAL OF QUANTUM ELECTRONICS | 1972年 / QE 8卷 / 08期
关键词：
D O I：
10.1109/JQE.1972.1077267
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：720 / +
页数：1
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