HOLOGRAPHIC INTERFEROMETRY MEASUREMENT OF THERMAL REFRACTIVE-INDEX COEFFICIENT AND THERMAL-EXPANSION COEFFICIENT OF ND-YAG AND ND-YALO

被引：15

|

作者：

YOUNG, DD

WILLIAMSON, TL

NICHOLS, ER

JUNGLING, KC

机构：

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1972年 / QE 8卷 / 08期

关键词：

D O I：

10.1109/JQE.1972.1077267

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：720 / +

页数：1

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