MAGNETIC PENETRATION DEPTH MEASUREMENTS IN LOW AND HIGH-TC THIN-FILM SUPERCONDUCTORS AT MICROWAVE-FREQUENCIES

被引：10
|
作者：
ANLAGE, SM
LANGLEY, B
HALBRITTER, J
TAHARA, S
SZE, H
SWITZ, N
EOM, CB
SNORTLAND, HJ
TABER, R
GEBALLE, TH
BEASLEY, MR
机构：
[1] KERNFORSCHUNGSZENTRUM KARLSRUHE GMBH,W-7500 KARLSRUHE 1,GERMANY
[2] HEWLETT PACKARD CO,SUPERCOND LAB,PALO ALTO,CA 94304
[3] NEC CORP LTD,MICROELECTR RES LABS,TSUKUBA,JAPAN
来源：
PHYSICA C | 1989年 / 162卷
关键词：
D O I：
10.1016/0921-4534(89)90864-2
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：1645 / 1646
页数：2
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