GROWTH OF EPITAXIAL BETA-FESI2 ON (100)SILICON USING FE-TI-SI DIFFUSION COUPLES

被引:1
|
作者
LARSEN, KK [1 ]
TAVARES, J [1 ]
BENDER, H [1 ]
DONATON, RA [1 ]
LAUWERS, A [1 ]
MAEX, K [1 ]
机构
[1] IMEC, B-3001 LOUVAIN, BELGIUM
关键词
D O I
10.1063/1.360580
中图分类号
O59 [应用物理学];
学科分类号
摘要
Epitaxial semiconducting iron-disilicide grains have been formed using an Fe-Ti bilayer on (100) silicon. The reaction kinetics of the Fe-Ti-Si diffusion couple have been studied in detail as a function of annealing conditions, and the intermediate titanium thickness. Both rapid thermal annealing and long-time furnace annealing have been used in this investigation. After a two-stage annealing sequence, with a selective wet etch removal of the unreacted top metal stack in between, a distinct trilayered structure was formed. This trilayer was found to consist of a top layer of smaller β-FeSi2 grains of random orientation, an amorphous Ti-O-Fe-Si layer with nanocrystallites embedded, and a bottom layer of uniformly large coherently epitaxial β-FeSi2 grains. © 1995 American Institute of Physics.
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页码:599 / 601
页数:3
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