MEASUREMENT OF THICKNESS AND DIFFUSION LENGTH OF THIN EPITAXIAL LAYERS OF GAP

被引:4
|
作者
STUPP, EH [1 ]
MILCH, A [1 ]
机构
[1] PHILIPS LABS,BRIARCLIFF MANOR,NY 10510
关键词
D O I
10.1063/1.323373
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:282 / 285
页数:4
相关论文
共 50 条
  • [41] Structure and magnetism of thin epitaxial layers
    Broehl, K.
    Boedeker, P.
    Metoki, N.
    Morawe, Ch.
    Schreyer, A.
    Stierle, A.
    Zeidler, T.
    Zabel, H.
    Ankner, J.F.
    Majkrzak, C.F.
    Vide, les Couches Minces, 1991, (259 Supp):
  • [42] DEVICE FOR THICKNESS MEASUREMENT OF SEMICONDUCTOR EPITAXIAL-FILMS ON LOW-RESISTANCE BASE LAYERS
    GORDIENKO, YE
    STAROSTE.VV
    DUDKIN, YA
    SHEVCHEN.VE
    PRIBORY I TEKHNIKA EKSPERIMENTA, 1974, (04): : 196 - 198
  • [43] MEASUREMENT OF THICKNESS OF LIQUID LAYERS
    GROSZ, T
    KALMAN, E
    MAGYAR KEMIAI FOLYOIRAT, 1975, 81 (05): : 193 - 196
  • [44] Measurement of diffusion lengths in quaternary semiconducting thin layers by spectrum imaging
    Walther, T
    PHYSICA B-CONDENSED MATTER, 2001, 308 : 1161 - 1164
  • [45] MEASUREMENT OF PHYSICAL THICKNESS AND REFRACTIVE-INDEX OF THIN EPITAXIAL GARNET-FILMS
    HENRY, RD
    SOOHOO, J
    MATERIALS RESEARCH BULLETIN, 1977, 12 (07) : 727 - 734
  • [46] MEASUREMENT OF LOCAL THICKNESS OF AMORPHOUS AND POLYCRYSTALLINE THIN LAYERS IN AN ELECTRON-MICROSCOPE
    ILJIN, NP
    POZSGAI, I
    MAGYAR KEMIAI FOLYOIRAT, 1977, 83 (11): : 510 - 514
  • [47] DIFFUSION OF ANTIMONY INTO SILICONE EPITAXIAL LAYERS FROM BURIED LAYERS
    NAKANUMA, S
    YAMAGISH.S
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY OF JAPAN, 1968, 36 (01): : 3 - &
  • [48] Measurement of the minority carrier diffusion length in thin wafers of semiconductor crystals
    Bolesov, IA
    Astakhov, VP
    Karpov, VV
    INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 2003, 46 (02) : 225 - 227
  • [49] Measurement of the minority carrier diffusion length in thin wafers of semiconductor crystals
    Bolesov, I.A.
    Astakhov, V.P.
    Karpov, V.V.
    Pribory i Tekhnika Eksperimenta, 2003, 46 (02): : 93 - 95
  • [50] Measurement of the Minority Carrier Diffusion Length in Thin Wafers of Semiconductor Crystals
    I. A. Bolesov
    V. P. Astakhov
    V. V. Karpov
    Instruments and Experimental Techniques, 2003, 46 : 225 - 227