COUNTER DIFFRACTOMETER - EFFECT OF SPECIMEN POSITION ON INTENSITY, POSITION, AND BREADTH OF X-RAY POWDER DIFFRACTION LINES

被引：0
|
作者：
WILSON, AJC
机构：
来源：
SOVIET PHYSICS CRYSTALLOGRAPHY, USSR | 1972年 / 16卷 / 06期
关键词：
D O I：
暂无
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
引用
收藏
页码：991 / &
相关论文
共 50 条
  • [11] AUTOMATED MULTIPLE-SPECIMEN HOLDER FOR AN X-RAY POWDER DIFFRACTOMETER
    WALKER, GA
    GOLDSMITH, CC
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (11): : 1619 - +
  • [12] Specimen holder for an X-ray diffractometer
    Gavrilenko, I.S.
    Industrial Laboratory (USSR) (English translation of Zavodskaya Laboratoriya), 1991, 56 (07):
  • [13] THE EFFECT OF VERTICAL DIVERGENCE ON X-RAY POWDER DIFFRACTION LINES
    ALEXANDER, L
    BRITISH JOURNAL OF APPLIED PHYSICS, 1953, 4 (MAR): : 92 - 93
  • [14] Selecting a specimen holder for x-ray powder diffraction
    Reibenspies, Joseph H., 1600, Advanstar Communications Inc. (38):
  • [15] Effect of specimen displacement in X-ray powder diffraction measurements with laboratory diffractometers
    Gateshki, M.
    Dortmann, Th.
    Degen, Th.
    Sadki, M.
    Norberg, N.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2024, 57 : 1336 - 1343
  • [16] Effect of specimen displacement in X-ray powder diffraction measurements with laboratory diffractometers
    Gateshki, M.
    Dortmann, Th.
    Degen, Th.
    Sadki, M.
    Norberg, N.
    Journal of Applied Crystallography, 2024, 57 : 1336 - 1343
  • [17] X-Ray diffraction on large single crystals using a powder diffractometer
    Jesche, A.
    Fix, M.
    Kreyssig, A.
    Meier, W. R.
    Canfield, P. C.
    PHILOSOPHICAL MAGAZINE, 2016, 96 (20) : 2115 - 2124
  • [18] The effect of sample position on the determination of triaxial stress by X-ray diffraction
    Fenn, R.H.
    Jones, A.M.
    Journal of Applied Crystallography, 1988, 21 (01): : 38 - 41
  • [19] An indexing algorithm independent of peak position extraction for X-ray powder diffraction patterns
    Coelho, Alan A.
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2017, 50 : 1323 - 1330
  • [20] NOVEL X-RAY DIFFRACTOMETER POSITION-SENSITIVE DETECTOR SYSTEM
    FRAASS, BA
    GRANFORS, PR
    HILLEKE, RO
    SIMMONS, RO
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1984, 55 (09): : 1455 - 1460
12345