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- [5] THE ELLIPSOMETER, AN APPARATUS TO MEASURE THICKNESSES OF THIN SURFACE FILMS REVIEW OF SCIENTIFIC INSTRUMENTS, 1945, 16 (02): : 26 - 30
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- [8] IMPROVED METHOD TO MEASURE THE THICKNESS OF THIN FILMS WITH A PHOTOELECTRIC ELLIPSOMETER REVIEW OF SCIENTIFIC INSTRUMENTS, 1957, 28 (04): : 283 - 285