ABERRATION MEASUREMENT USING AXIAL INTENSITY

被引：12
|
作者：
GONG, Q
HSU, SS
机构：
来源：
OPTICAL ENGINEERING | 1994年 / 33卷 / 04期
关键词：
OPTICAL TESTING; AXIAL INTENSITY; OPTICAL ABERRATIONS;
D O I：
10.1117/12.163190
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A method of measuring optical aberrations using axial intensity information near paraxial focus is described. This method can be applied to systems with or without central obscurations. The axial intensity profile can also be used to determine the location of paraxial focus in a centrally obscured system, a measurement that is difficult to achieve using other methods. The experimental data demonstrate good agreement with theoretical predictions.
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页码：1176 / 1186
页数：11
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