FEEDBACK STABILIZATION OF FIELD-EMISSION PROBE CURRENT

被引：0
|
作者：
NOMURA, S
KOMODA, T
KAMIRYO, T
NAKAIZUM.Y
机构：
[1] HITACHI CENT RES LAB,HITACHI,JAPAN
[2] HITACHI NAKA WORKS,HITACHI,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1973年 / 22卷 / 03期
关键词：
D O I：
暂无
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：281 / 282
页数：2
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